Sources of electron and ion beams, electrostatic, magnetostatic lenses, charhe particles monochromators and analysators, time of flight, magnetic, dynamic mass spectrometers, interpretation of mass spectra.

Type of methodology: Combination of lecture and hands-on

Participants receive the certificate of attendance: Yes

Paid training activity for participants: Yes, for all

Participants prerequisite knowledge: Numerical methods (linear algebra, statistics); Domain-specific background knowledge